Mueller matrix modeling of thick anisotropic crystals with metallic coatings

Alexander T. Martin, Shane M. Nichols, Melissa Tan, Bart Kahr

Research output: Contribution to journalArticle

Abstract

The optical behavior of thin multilayer systems can be analyzed by generalized ellipsometry and modeled using transfer matrices. Recently, a method has been implemented for modeling the interference of multiply-reflected partial waves in the spectroscopic study of bianisotropic crystals of moderate thickness using light sources of finite coherence. Here, a partial wave model is compared to reflection Mueller matrix measurements in order to simultaneously and accurately determine the thickness of distinct hetero-metallic thin films that flank a bianisotropic crystal whose thickness corresponds to the partial wave regime.

Original languageEnglish (US)
Pages (from-to)578-584
Number of pages7
JournalApplied Surface Science
Volume421
DOIs
StatePublished - Nov 1 2017

Keywords

  • Coherence
  • Ellipsometry
  • Mueller matrix
  • Multiple reflections
  • Thin films

ASJC Scopus subject areas

  • Chemistry(all)
  • Condensed Matter Physics
  • Physics and Astronomy(all)
  • Surfaces and Interfaces
  • Surfaces, Coatings and Films

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