Mueller matrix polarimetry with four photoelastic modulators: Theory and calibration

Oriol Arteaga; John Freudenthal; Baoliang Wang; Bart Kahr

doi:10.1364/AO.51.006805

Mueller matrix polarimetry with four photoelastic modulators: Theory and calibration

Oriol Arteaga, John Freudenthal, Baoliang Wang, Bart Kahr

Chemistry

Research output: Contribution to journal › Article › peer-review

Abstract

A spectroscopic Mueller matrix polarimeter with four photoelastic modulators (PEMs) and no moving parts is introduced. In the 4-PEM polarimeter, all the elements of the Mueller matrix are simultaneously determined from the analysis of the frequencies of the time-dependent intensity of the light beam.

Original language	English (US)
Pages (from-to)	6805-6817
Number of pages	13
Journal	Applied Optics
Volume	51
Issue number	28
DOIs	https://doi.org/10.1364/AO.51.006805
State	Published - Oct 1 2012

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics
Engineering (miscellaneous)
Electrical and Electronic Engineering

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10.1364/AO.51.006805

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title = "Mueller matrix polarimetry with four photoelastic modulators: Theory and calibration",

abstract = "A spectroscopic Mueller matrix polarimeter with four photoelastic modulators (PEMs) and no moving parts is introduced. In the 4-PEM polarimeter, all the elements of the Mueller matrix are simultaneously determined from the analysis of the frequencies of the time-dependent intensity of the light beam.",

author = "Oriol Arteaga and John Freudenthal and Baoliang Wang and Bart Kahr",

year = "2012",

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doi = "10.1364/AO.51.006805",

language = "English (US)",

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journal = "Applied Optics",

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AU - Freudenthal, John

AU - Wang, Baoliang

AU - Kahr, Bart

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Mueller matrix polarimetry with four photoelastic modulators: Theory and calibration

Abstract

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