Multi-layer dependability: From microarchitecture to application level

Jörg Henkel, Lars Bauer, Hongyan Zhang, Semeen Rehman, Muhammad Shafique

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We show in this paper that multi-layer dependability is an indispensable way to cope with the increasing amount of technology-induced dependability problems that threaten to proceed further scaling. We introduce the definition of multi-layer dependability and present our design flow within this paradigm that seamlessly integrates techniques starting at circuit layer all the way up to application layer and thereby accounting for ASIC-based architectures as well as for reconfigurable-based architectures. At the end, we give evidence that the paradigm of multi-layer dependability bears a large potential for significantly increasing dependability at reasonable effort.

Original languageEnglish (US)
Title of host publicationDAC 2014 - 51st Design Automation Conference, Conference Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781479930173
StatePublished - 2014
Event51st Annual Design Automation Conference, DAC 2014 - San Francisco, CA, United States
Duration: Jun 2 2014Jun 5 2014

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X


Other51st Annual Design Automation Conference, DAC 2014
Country/TerritoryUnited States
CitySan Francisco, CA

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation


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