Abstract
Ferromagnetic resonance (FMR) was used to characterize a series of Fe films sputter-deposited on 20 nm pore diameter nano-channel alumina (NCA). For each sample, several spectra were recorded as a function of the angle between the applied field and the film plane. The obtained spectra consisted of one or two absorption lines generally located at fields below 3300 Oe.
| Original language | English (US) |
|---|---|
| Pages (from-to) | CQ-11 |
| Journal | Digests of the Intermag Conference |
| State | Published - 2000 |
| Event | 2000 IEEE International Magnetics Conference-2000 IEEE INTERMAG - Toronto, Ont, Can Duration: Apr 9 2000 → Apr 13 2000 |
ASJC Scopus subject areas
- Electrical and Electronic Engineering