Ferromagnetic resonance (FMR) was used to characterize a series of Fe films sputter-deposited on 20 nm pore diameter nano-channel alumina (NCA). For each sample, several spectra were recorded as a function of the angle between the applied field and the film plane. The obtained spectra consisted of one or two absorption lines generally located at fields below 3300 Oe.
ASJC Scopus subject areas
- Electrical and Electronic Engineering