New AFM Developments to Study Elasticity and Adhesion at the Nanoscale

Robert Szoszkiewicz, Elisa Riedo

Research output: Chapter in Book/Report/Conference proceedingChapter (peer-reviewed)

Original languageEnglish (US)
Title of host publicationApplied Scanning Probe Methods V
PublisherSpringer
StatePublished - 2007

Publication series

NameNanoScience and Technology

Cite this

Szoszkiewicz, R., & Riedo, E. (2007). New AFM Developments to Study Elasticity and Adhesion at the Nanoscale. In Applied Scanning Probe Methods V (NanoScience and Technology). Springer.