| Original language | English (US) |
|---|---|
| Title of host publication | Applied Scanning Probe Methods V |
| Publisher | Springer |
| State | Published - 2007 |
Publication series
| Name | NanoScience and Technology |
|---|
New AFM Developments to Study Elasticity and Adhesion at the Nanoscale
Robert Szoszkiewicz, Elisa Riedo
Research output: Chapter in Book/Report/Conference proceeding › Chapter (peer-reviewed) › peer-review