New scan attacks against state-of-the-art countermeasures and DFT

Sk Subidh Ali, Ozgur Sinanoglu, Samah Mohamed Saeed, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scan attack has been known as a threat to Design for Testability (DFT). All the existing attacks require both the normal mode and the test mode of the device. In normal mode the intermediate results of a crypto-hardware are captured in scan chains and in the test mode the results are shifted out. One simple countermeasure for this kind of attacks is to reset the device whenever there is a switch of the mode. A recent test-mode-only attack shows that the mode-reset countermeasure is insecure against scan attack. An attack is still possible using only the test mode of the device. However, the attack was presented without the presence of an on-chip test compactor. In this paper we propose a new test-mode-only attack on AES hardware which works in the presence of an on-chip response compactor. The proposed attack retrieves the secret key with negligible time complexity. The attack results show that DFT infrastructures with response compactor are vulnerable to scan attack even in the presence of mode-reset countermeasure.

Original languageEnglish (US)
Title of host publicationProceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2014
PublisherIEEE Computer Society
Pages142-147
Number of pages6
ISBN (Print)9781479941148
DOIs
StatePublished - 2014
Event2014 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2014 - Arlington, VA, United States
Duration: May 6 2014May 7 2014

Publication series

NameProceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2014

Other

Other2014 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2014
CountryUnited States
CityArlington, VA
Period5/6/145/7/14

Keywords

  • AES
  • Scan Attack
  • Scan Chain
  • Scan-based DFT
  • Security
  • Testability

ASJC Scopus subject areas

  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality

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  • Cite this

    Ali, S. S., Sinanoglu, O., Saeed, S. M., & Karri, R. (2014). New scan attacks against state-of-the-art countermeasures and DFT. In Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2014 (pp. 142-147). [6855585] (Proceedings of the 2014 IEEE International Symposium on Hardware-Oriented Security and Trust, HOST 2014). IEEE Computer Society. https://doi.org/10.1109/HST.2014.6855585