New scan-based attack using only the test mode and an input corruption countermeasure

Sk Subidh Ali; Samah Mohamed Saeed; Ozgur Sinanoglu; Ramesh Karri

doi:10.1007/978-3-319-23799-2_3

New scan-based attack using only the test mode and an input corruption countermeasure

Sk Subidh Ali, Samah Mohamed Saeed, Ozgur Sinanoglu, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Scan-based design-for-testability, which improves access and thus the test quality, is highly vulnerable to scan attack. While in-field test is enabled through the scan design to provide debug capabilities, an attacker can leverage the test mode to leak the secret key of the chip. The scan attack can be thwarted by a simple defense that resets the data upon a switch from the normal mode to the test mode. We proposed a new class of scan attack in [15] using only the test mode of a chip, circumventing this defense. In this book chapter we extend our earlier work by introducing case studies to explain this new attack in greater detail. Furthermore, we study the effectiveness of existing countermeasures to thwart the attack and propose a new input corruption countermeasure that requires a smaller area overhead compared to the existing countermeasures.

Original language	English (US)
Title of host publication	VLSI-SoC
Subtitle of host publication	At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Revised and Extended Selected Papers
Editors	H. Fatih Ugurdag, Luís Miguel Silveira, Ricardo Reis, Alex Orailoglu, Martin Margala
Publisher	Springer New York LLC
Pages	48-68
Number of pages	21
ISBN (Print)	9783319237985
DOIs	https://doi.org/10.1007/978-3-319-23799-2_3
State	Published - 2015
Event	21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Istanbul, Turkey Duration: Oct 6 2013 → Oct 9 2013

Publication series

Name	IFIP Advances in Information and Communication Technology
Volume	461
ISSN (Print)	1868-4238

Other

Other	21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013
Country/Territory	Turkey
City	Istanbul
Period	10/6/13 → 10/9/13

Keywords

AES
Scan attack
Scan chain
Scan-based dft
Security
Testability

ASJC Scopus subject areas

Information Systems
Computer Networks and Communications
Information Systems and Management

Access to Document

10.1007/978-3-319-23799-2_3

Cite this

Ali, S. S., Saeed, S. M., Sinanoglu, O., & Karri, R. (2015). New scan-based attack using only the test mode and an input corruption countermeasure. In H. F. Ugurdag, L. M. Silveira, R. Reis, A. Orailoglu, & M. Margala (Eds.), VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Revised and Extended Selected Papers (pp. 48-68). (IFIP Advances in Information and Communication Technology; Vol. 461). Springer New York LLC. https://doi.org/10.1007/978-3-319-23799-2_3

New scan-based attack using only the test mode and an input corruption countermeasure. / Ali, Sk Subidh; Saeed, Samah Mohamed; Sinanoglu, Ozgur et al.
VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Revised and Extended Selected Papers. ed. / H. Fatih Ugurdag; Luís Miguel Silveira; Ricardo Reis; Alex Orailoglu; Martin Margala. Springer New York LLC, 2015. p. 48-68 (IFIP Advances in Information and Communication Technology; Vol. 461).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Ali, SS, Saeed, SM, Sinanoglu, O & Karri, R 2015, New scan-based attack using only the test mode and an input corruption countermeasure. in HF Ugurdag, LM Silveira, R Reis, A Orailoglu & M Margala (eds), VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Revised and Extended Selected Papers. IFIP Advances in Information and Communication Technology, vol. 461, Springer New York LLC, pp. 48-68, 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Istanbul, Turkey, 10/6/13. https://doi.org/10.1007/978-3-319-23799-2_3

Ali SS, Saeed SM, Sinanoglu O , Karri R. New scan-based attack using only the test mode and an input corruption countermeasure. In Ugurdag HF, Silveira LM, Reis R, Orailoglu A, Margala M, editors, VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Revised and Extended Selected Papers. Springer New York LLC. 2015. p. 48-68. (IFIP Advances in Information and Communication Technology). doi: 10.1007/978-3-319-23799-2_3

Ali, Sk Subidh ; Saeed, Samah Mohamed ; Sinanoglu, Ozgur et al. / New scan-based attack using only the test mode and an input corruption countermeasure. VLSI-SoC: At the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Revised and Extended Selected Papers. editor / H. Fatih Ugurdag ; Luís Miguel Silveira ; Ricardo Reis ; Alex Orailoglu ; Martin Margala. Springer New York LLC, 2015. pp. 48-68 (IFIP Advances in Information and Communication Technology).

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New scan-based attack using only the test mode and an input corruption countermeasure

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