New scan-based attack using only the test mode and an input corruption countermeasure

Sk Subidh Ali, Samah Mohamed Saeed, Ozgur Sinanoglu, Ramesh Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Scan-based design-for-testability, which improves access and thus the test quality, is highly vulnerable to scan attack. While in-field test is enabled through the scan design to provide debug capabilities, an attacker can leverage the test mode to leak the secret key of the chip. The scan attack can be thwarted by a simple defense that resets the data upon a switch from the normal mode to the test mode. We proposed a new class of scan attack in [15] using only the test mode of a chip, circumventing this defense. In this book chapter we extend our earlier work by introducing case studies to explain this new attack in greater detail. Furthermore, we study the effectiveness of existing countermeasures to thwart the attack and propose a new input corruption countermeasure that requires a smaller area overhead compared to the existing countermeasures.

Original languageEnglish (US)
Title of host publicationVLSI-SoC
Subtitle of host publicationAt the Crossroads of Emerging Trends - 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013, Revised and Extended Selected Papers
EditorsH. Fatih Ugurdag, Luís Miguel Silveira, Ricardo Reis, Alex Orailoglu, Martin Margala
PublisherSpringer New York LLC
Pages48-68
Number of pages21
ISBN (Print)9783319237985
DOIs
StatePublished - 2015
Event21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013 - Istanbul, Turkey
Duration: Oct 6 2013Oct 9 2013

Publication series

NameIFIP Advances in Information and Communication Technology
Volume461
ISSN (Print)1868-4238

Other

Other21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013
CountryTurkey
CityIstanbul
Period10/6/1310/9/13

Keywords

  • AES
  • Scan attack
  • Scan chain
  • Scan-based dft
  • Security
  • Testability

ASJC Scopus subject areas

  • Information Systems
  • Computer Networks and Communications
  • Information Systems and Management

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