@inproceedings{d239d5cbff134a5295ac7b6a08abb58b,
title = "New scan-based attack using only the test mode and an input corruption countermeasure",
abstract = "Scan-based design-for-testability, which improves access and thus the test quality, is highly vulnerable to scan attack. While in-field test is enabled through the scan design to provide debug capabilities, an attacker can leverage the test mode to leak the secret key of the chip. The scan attack can be thwarted by a simple defense that resets the data upon a switch from the normal mode to the test mode. We proposed a new class of scan attack in [15] using only the test mode of a chip, circumventing this defense. In this book chapter we extend our earlier work by introducing case studies to explain this new attack in greater detail. Furthermore, we study the effectiveness of existing countermeasures to thwart the attack and propose a new input corruption countermeasure that requires a smaller area overhead compared to the existing countermeasures.",
keywords = "AES, Scan attack, Scan chain, Scan-based dft, Security, Testability",
author = "Ali, {Sk Subidh} and Saeed, {Samah Mohamed} and Ozgur Sinanoglu and Ramesh Karri",
note = "Publisher Copyright: {\textcopyright} IFIP International Federation for Information Processing 2015.; 21st IFIP WG 10.5/IEEE International Conference on Very Large Scale Integration, VLSI-SoC 2013 ; Conference date: 06-10-2013 Through 09-10-2013",
year = "2015",
doi = "10.1007/978-3-319-23799-2_3",
language = "English (US)",
isbn = "9783319237985",
series = "IFIP Advances in Information and Communication Technology",
publisher = "Springer New York LLC",
pages = "48--68",
editor = "Ugurdag, {H. Fatih} and Silveira, {Lu{\'i}s Miguel} and Ricardo Reis and Alex Orailoglu and Martin Margala",
booktitle = "VLSI-SoC",
}