TY - GEN
T1 - New trends in dark silicon
AU - Henkel, Jörg
AU - Khdr, Heba
AU - Pagani, Santiago
AU - Shafique, Muhammad
N1 - Publisher Copyright:
© 2015 ACM.
Copyright:
Copyright 2015 Elsevier B.V., All rights reserved.
PY - 2015/7/24
Y1 - 2015/7/24
N2 - This paper presents new trends in dark silicon reflecting, among others, the deployment of FinFETs in recent technology nodes and the impact of voltage/frquency scaling, which lead to new less-conservative predictions. The focus is on dark silicon from a thermal perspective: we show that it is not simply the chIP's total power budget, e.g., the Thermal Design Power (TDP), that leads to the dark silicon problem, but instead it is the power density and related thermal effects. We therefore propose to use Thermal Safe Power (TSP) as a more efficient power budget. It is also shown that sophisticated spatio-temporal mapping decisions result in improved thermal profiles with reduced peak temperatures. Moreover, we discuss the implications of Near-Threshold Computing (NTC) and employment of Boosting techniques in dark silicon systems.
AB - This paper presents new trends in dark silicon reflecting, among others, the deployment of FinFETs in recent technology nodes and the impact of voltage/frquency scaling, which lead to new less-conservative predictions. The focus is on dark silicon from a thermal perspective: we show that it is not simply the chIP's total power budget, e.g., the Thermal Design Power (TDP), that leads to the dark silicon problem, but instead it is the power density and related thermal effects. We therefore propose to use Thermal Safe Power (TSP) as a more efficient power budget. It is also shown that sophisticated spatio-temporal mapping decisions result in improved thermal profiles with reduced peak temperatures. Moreover, we discuss the implications of Near-Threshold Computing (NTC) and employment of Boosting techniques in dark silicon systems.
UR - http://www.scopus.com/inward/record.url?scp=84944104297&partnerID=8YFLogxK
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U2 - 10.1145/2744769.2747938
DO - 10.1145/2744769.2747938
M3 - Conference contribution
AN - SCOPUS:84944104297
T3 - Proceedings - Design Automation Conference
BT - 2015 52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 52nd ACM/EDAC/IEEE Design Automation Conference, DAC 2015
Y2 - 8 June 2015 through 12 June 2015
ER -