TY - JOUR
T1 - Non-uniform triggering of gg-nMOSt investigated by combined emission microscopy and transmission line pulsing
AU - Russ, Christian
AU - Bock, Karlheinz
AU - Rasras, Mahmoud
AU - De Wolf, Ingrid
AU - Groeseneken, Guido
AU - Maes, Herman E.
N1 - Funding Information:
The authors thank Bart Keppens (IMEC) for his support in coupling the TLP and with the EMMI, and Jim Colvin (WSI) as mentor of this paper. The work is being funded by the Commission of the European Community in the ESPRIT project ‘ESDEM’ and by Alcatel Bell in the frame of a project with the Flemish Institute for Technological Research in Industry (IWT).
Copyright:
Copyright 2004 Elsevier Science B.V., Amsterdam. All rights reserved.
PY - 1998
Y1 - 1998
N2 - The triggering of gg-nMOS and field-oxide devices, essential for optimized protection design, is addressed fly TLP-pulsed emission microscopy. Current non-uniformity and instability effects in snapback operation under DC and TLP conditions are demonstrated. The comprehensive correlation of emission and electrical behavior allows an improved interpretation of device operation. Technological influences on the trigger uniformity are discussed.
AB - The triggering of gg-nMOS and field-oxide devices, essential for optimized protection design, is addressed fly TLP-pulsed emission microscopy. Current non-uniformity and instability effects in snapback operation under DC and TLP conditions are demonstrated. The comprehensive correlation of emission and electrical behavior allows an improved interpretation of device operation. Technological influences on the trigger uniformity are discussed.
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M3 - Conference article
AN - SCOPUS:0032320896
SN - 0739-5159
SP - 177
EP - 186
JO - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
JF - Electrical Overstress/Electrostatic Discharge Symposium Proceedings
T2 - Proceedings of the 1998 20th Annual International EOS/ESD Symposium
Y2 - 6 October 1998 through 8 October 1998
ER -