TY - GEN
T1 - Obfuscating the interconnects
T2 - 36th IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017
AU - Patnaik, Satwik
AU - Ashra, Mohammed
AU - Knechtel, Johann
AU - Sinanoglu, Ozgur
N1 - Publisher Copyright:
© 2017 IEEE.
PY - 2017/12/13
Y1 - 2017/12/13
N2 - Layout camouflaging (LC) is a promising technique to protect chip design intellectual property (IP) from reverse engineers. Most prior art, however, cannot leverage the full potential of LC due to excessive overheads and/or their limited scope on an FEOL-centric and accordingly customized manufacturing process. If at all, most existing techniques can be reasonably applied only to selected parts of a chip - we argue that such 'small-scale or custom camouflaging' will eventually be circumvented, irrespective of the underlying technique. In this work, we propose a novel LC scheme which is low-cost and generic - full-chip LC can finally be realized without any reservation. Our scheme is based on obfuscating the interconnects (BEOL); it can be readily applied to any design without modifications in the device layer (FEOL). Applied with split manufacturing in conjunction, our approach is the first in the literature to cope with both the FEOL fab and the end-user being untrustworthy. We implement and evaluate our primitives at the (DRC-clean) layout level; our scheme incurs significantly lower cost than most of the previous works. When comparing fully camouflaged to original layouts (i.e., for 100% LC), we observe on average power, performance, and area overheads of 12%, 30%, and 48%, respectively. Here we also show empirically that most existing LC techniques (as well as ours) can only provide proper resilience against powerful SAT attacks once at least 50% of the layout is camouflaged - only large-scale LC is practically secure. As indicated, our approach can deliver even 100% LC at acceptable cost. Finally, we also make our flow publicly available, enabling the community to protect their sensitive designs.
AB - Layout camouflaging (LC) is a promising technique to protect chip design intellectual property (IP) from reverse engineers. Most prior art, however, cannot leverage the full potential of LC due to excessive overheads and/or their limited scope on an FEOL-centric and accordingly customized manufacturing process. If at all, most existing techniques can be reasonably applied only to selected parts of a chip - we argue that such 'small-scale or custom camouflaging' will eventually be circumvented, irrespective of the underlying technique. In this work, we propose a novel LC scheme which is low-cost and generic - full-chip LC can finally be realized without any reservation. Our scheme is based on obfuscating the interconnects (BEOL); it can be readily applied to any design without modifications in the device layer (FEOL). Applied with split manufacturing in conjunction, our approach is the first in the literature to cope with both the FEOL fab and the end-user being untrustworthy. We implement and evaluate our primitives at the (DRC-clean) layout level; our scheme incurs significantly lower cost than most of the previous works. When comparing fully camouflaged to original layouts (i.e., for 100% LC), we observe on average power, performance, and area overheads of 12%, 30%, and 48%, respectively. Here we also show empirically that most existing LC techniques (as well as ours) can only provide proper resilience against powerful SAT attacks once at least 50% of the layout is camouflaged - only large-scale LC is practically secure. As indicated, our approach can deliver even 100% LC at acceptable cost. Finally, we also make our flow publicly available, enabling the community to protect their sensitive designs.
UR - http://www.scopus.com/inward/record.url?scp=85043491757&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85043491757&partnerID=8YFLogxK
U2 - 10.1109/ICCAD.2017.8203758
DO - 10.1109/ICCAD.2017.8203758
M3 - Conference contribution
AN - SCOPUS:85043491757
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 41
EP - 48
BT - 2017 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2017
PB - Institute of Electrical and Electronics Engineers Inc.
Y2 - 13 November 2017 through 16 November 2017
ER -