We have measured the tunneling characteristics (dVdI and d2VdI2 versus V) of thin film junctions of the form Al-I-M-Pb, where M is Ag, Cu, or Al. These tunneling characteristics have dips at voltages corresponding to peaks in the phonon density of states of M and peaks at voltages corresponding to the peaks in the phonon density of states of Pb. From the amplitude of the dips due to the phonons of M we can crudely estimate the electron-phonon coupling constant M for Al and Cu.
ASJC Scopus subject areas
- Physics and Astronomy(all)