Abstract
We have measured the tunneling characteristics (dVdI and d2VdI2 versus V) of thin film junctions of the form Al-I-M-Pb, where M is Ag, Cu, or Al. These tunneling characteristics have dips at voltages corresponding to peaks in the phonon density of states of M and peaks at voltages corresponding to the peaks in the phonon density of states of Pb. From the amplitude of the dips due to the phonons of M we can crudely estimate the electron-phonon coupling constant M for Al and Cu.
Original language | English (US) |
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Pages (from-to) | 1552-1555 |
Number of pages | 4 |
Journal | Physical Review Letters |
Volume | 36 |
Issue number | 26 |
DOIs | |
State | Published - 1976 |
ASJC Scopus subject areas
- General Physics and Astronomy