On-line error detection and BIST for the AES encryption algorithm with different S-box implementations

V. Ocheretnij, G. Kouznetsov, R. Karri, M. Gössel

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

In this paper we experimentally investigate the efficiency of concurrent checking for the AES encryption algorithm (Rijndael) by parity modification according to [3]. Also we propose a simple new BIST method. For BIST the implementation of the AES algorithm itself is used as well as a pseudo-random test input generator and a compactor of the test results. Thereby we utilized the property of the AES algorithm that arbitrarily given plain texts are encrypted by the successive rounds into "pseudo-random" cipher texts which are the (test) inputs for the next round. The complete data path of the AES algorithm is simulated as a netlist of AND-, NAND-, OR-, NOR- and XOR-gates. All possible single stuck-at faults are injected and simulated. For a special implementation of the S-boxes all errors within the datapath of the AES algorithm due to single stuck-at faults are immediately detected.

Original languageEnglish (US)
Title of host publicationProceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005
Pages141-146
Number of pages6
DOIs
StatePublished - 2005
Event11th IEEE International On-Line Testing Symposium, IOLTS 2005 - French Riviera, France
Duration: Jul 6 2005Jul 8 2005

Publication series

NameProceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005
Volume2005

Other

Other11th IEEE International On-Line Testing Symposium, IOLTS 2005
CountryFrance
CityFrench Riviera
Period7/6/057/8/05

ASJC Scopus subject areas

  • Engineering(all)

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    Ocheretnij, V., Kouznetsov, G., Karri, R., & Gössel, M. (2005). On-line error detection and BIST for the AES encryption algorithm with different S-box implementations. In Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005 (pp. 141-146). [1498148] (Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005; Vol. 2005). https://doi.org/10.1109/IOLTS.2005.51