TY - GEN
T1 - On-line error detection and BIST for the AES encryption algorithm with different S-box implementations
AU - Ocheretnij, V.
AU - Kouznetsov, G.
AU - Karri, R.
AU - Gössel, M.
PY - 2005
Y1 - 2005
N2 - In this paper we experimentally investigate the efficiency of concurrent checking for the AES encryption algorithm (Rijndael) by parity modification according to [3]. Also we propose a simple new BIST method. For BIST the implementation of the AES algorithm itself is used as well as a pseudo-random test input generator and a compactor of the test results. Thereby we utilized the property of the AES algorithm that arbitrarily given plain texts are encrypted by the successive rounds into "pseudo-random" cipher texts which are the (test) inputs for the next round. The complete data path of the AES algorithm is simulated as a netlist of AND-, NAND-, OR-, NOR- and XOR-gates. All possible single stuck-at faults are injected and simulated. For a special implementation of the S-boxes all errors within the datapath of the AES algorithm due to single stuck-at faults are immediately detected.
AB - In this paper we experimentally investigate the efficiency of concurrent checking for the AES encryption algorithm (Rijndael) by parity modification according to [3]. Also we propose a simple new BIST method. For BIST the implementation of the AES algorithm itself is used as well as a pseudo-random test input generator and a compactor of the test results. Thereby we utilized the property of the AES algorithm that arbitrarily given plain texts are encrypted by the successive rounds into "pseudo-random" cipher texts which are the (test) inputs for the next round. The complete data path of the AES algorithm is simulated as a netlist of AND-, NAND-, OR-, NOR- and XOR-gates. All possible single stuck-at faults are injected and simulated. For a special implementation of the S-boxes all errors within the datapath of the AES algorithm due to single stuck-at faults are immediately detected.
UR - http://www.scopus.com/inward/record.url?scp=33745489169&partnerID=8YFLogxK
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U2 - 10.1109/IOLTS.2005.51
DO - 10.1109/IOLTS.2005.51
M3 - Conference contribution
AN - SCOPUS:33745489169
SN - 0769524060
SN - 9780769524061
T3 - Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005
SP - 141
EP - 146
BT - Proceedings - 11th IEEE International On-Line Testing Symposium, IOLTS 2005
T2 - 11th IEEE International On-Line Testing Symposium, IOLTS 2005
Y2 - 6 July 2005 through 8 July 2005
ER -