TY - GEN
T1 - On the impact of manufacturing process variations on the lifetime of sensor networks
AU - Garg, Siddharth
AU - Marculescu, Diana
PY - 2007
Y1 - 2007
N2 - As an emerging technology, sensor networks provide the ability to accurately monitor the characteristics of wide geographical areas over long periods of time. The lifetime of individual nodes in a sensor network depends strongly on the leakage power that the nodes dissipate in the idle state, especially for low-throughput applications. With the introduction of advanced low power design techniques, such as sub-threshold voltage design styles, and the migration of fabrication processes to smaller technology generations, variability in leakage power dissipation of the sensor nodes will lead to increased variability in their lifetimes. In this paper, we analyze how this increased variability in the lifetime of individual sensor nodes affects the performance and lifetime of the network as a whole. We demonstrate how sensor network designers can use the proposed analysis framework to trade-off the cost of a sensor network deployment with the performance it offers. Our results indicate that up to 37% improvement in the critical lifetime of a sensor network (defined as the expected time at which the sensor network becomes disconnected) can be obtained over a baseline design with a 20% increase in the cost of the individual sensor nodes.
AB - As an emerging technology, sensor networks provide the ability to accurately monitor the characteristics of wide geographical areas over long periods of time. The lifetime of individual nodes in a sensor network depends strongly on the leakage power that the nodes dissipate in the idle state, especially for low-throughput applications. With the introduction of advanced low power design techniques, such as sub-threshold voltage design styles, and the migration of fabrication processes to smaller technology generations, variability in leakage power dissipation of the sensor nodes will lead to increased variability in their lifetimes. In this paper, we analyze how this increased variability in the lifetime of individual sensor nodes affects the performance and lifetime of the network as a whole. We demonstrate how sensor network designers can use the proposed analysis framework to trade-off the cost of a sensor network deployment with the performance it offers. Our results indicate that up to 37% improvement in the critical lifetime of a sensor network (defined as the expected time at which the sensor network becomes disconnected) can be obtained over a baseline design with a 20% increase in the cost of the individual sensor nodes.
KW - Leakage power variability
KW - Lifetime
KW - Manufacturing process variations
KW - Sensor networks
UR - http://www.scopus.com/inward/record.url?scp=38849197461&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=38849197461&partnerID=8YFLogxK
U2 - 10.1145/1289816.1289866
DO - 10.1145/1289816.1289866
M3 - Conference contribution
AN - SCOPUS:38849197461
SN - 9781595938244
T3 - CODES+ISSS 2007: International Conference on Hardware/Software Codesign and System Synthesis
SP - 203
EP - 208
BT - CODES+ISSS 2007
T2 - CODES+ISSS 2007: 5th International Conference on Hardware/Software Codesign and System Synthesis
Y2 - 30 September 2007 through 3 October 2007
ER -