Abstract
The ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle-adjustable transmission filter, simple optics and a CCD camera can capture spatially-dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.
| Original language | English (US) |
|---|---|
| Article number | 045021 |
| Journal | 2D Materials |
| Volume | 4 |
| Issue number | 4 |
| DOIs | |
| State | Published - Sep 28 2017 |
Keywords
- optical measurement
- photoluminescence
- physical unclonable functions
- security
- transition metal dichalcogenide
ASJC Scopus subject areas
- Chemistry(all)
- Materials Science(all)
- Condensed Matter Physics
- Mechanics of Materials
- Mechanical Engineering
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Optical identification using imperfections in 2D materials. / Cao, Yameng; Robson, Alexander J.; Alharbi, Abdullah; Roberts, Jonathan; Woodhead, Christopher S.; Noori, Yasir J.; Bernardo-Gavito, Ramón; Shahrjerdi, Davood; Roedig, Utz; Fal'Ko, Vladimir I.; Young, Robert J.
In: 2D Materials, Vol. 4, No. 4, 045021, 28.09.2017.Research output: Contribution to journal › Article › peer-review
}
TY - JOUR
T1 - Optical identification using imperfections in 2D materials
AU - Cao, Yameng
AU - Robson, Alexander J.
AU - Alharbi, Abdullah
AU - Roberts, Jonathan
AU - Woodhead, Christopher S.
AU - Noori, Yasir J.
AU - Bernardo-Gavito, Ramón
AU - Shahrjerdi, Davood
AU - Roedig, Utz
AU - Fal'Ko, Vladimir I.
AU - Young, Robert J.
N1 - Funding Information: Yameng Cao Alexander J Robson Abdullah Alharbi Jonathan Roberts Christopher S Woodhead Yasir J Noori Ram�n Bernardo-Gavito Davood Shahrjerdi Utz Roedig Vladimir I Fal’ko Robert J Young Yameng Cao Alexander J Robson Abdullah Alharbi Jonathan Roberts Christopher S Woodhead Yasir J Noori Ram�n Bernardo-Gavito Davood Shahrjerdi Utz Roedig Vladimir I Fal’ko Robert J Young Physics Department, Lancaster University, Lancaster, LA1 4YB, United Kingdom Electrical and Computer Engineering, New York University, Brooklyn, New York 11201, United States of America School of Computing and Communications, Lancaster University, Lancaster, LA1 4WA, United Kingdom National Graphene Institute, The University of Manchester, Manchester, M13 9PL, United Kingdom Yameng Cao, Alexander J Robson, Abdullah Alharbi, Jonathan Roberts, Christopher S Woodhead, Yasir J Noori, Ram�n Bernardo-Gavito, Davood Shahrjerdi, Utz Roedig, Vladimir I Fal’ko and Robert J Young 2017-12-01 2017-09-28 10:38:10 cgi/release: Article released bin/incoming: New from .zip Original content from this work may be used under the terms of the Creative Commons Attribution 3.0 licence . Any further distribution of this work must maintain attribution to the author(s) and the title of the work, journal citation and DOI. Engineering and Physical Sciences Research Council https://doi.org/10.13039/501100000266 EP/K50421X/1 EP/L01548X/1 National Science Foundation https://doi.org/10.13039/100000001 1638598 Royal Society https://doi.org/10.13039/501100000288 University Fellowship UF110555 University Fellowship UF160721 Air Force Office of Scientific Research https://doi.org/10.13039/100000181 FA9550-16-1-0276 yes The ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle-adjustable transmission filter, simple optics and a CCD camera can capture spatially-dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting. � 2017 IOP Publishing Ltd [1] Roberts J et al 2015 Sci. Rep. 5 16456 10.1038/srep16456 Roberts J et al Sci. 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PY - 2017/9/28
Y1 - 2017/9/28
N2 - The ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle-adjustable transmission filter, simple optics and a CCD camera can capture spatially-dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.
AB - The ability to uniquely identify an object or device is important for authentication. Imperfections, locked into structures during fabrication, can be used to provide a fingerprint that is challenging to reproduce. In this paper, we propose a simple optical technique to read unique information from nanometer-scale defects in 2D materials. Imperfections created during crystal growth or fabrication lead to spatial variations in the bandgap of 2D materials that can be characterized through photoluminescence measurements. We show a simple setup involving an angle-adjustable transmission filter, simple optics and a CCD camera can capture spatially-dependent photoluminescence to produce complex maps of unique information from 2D monolayers. Atomic force microscopy is used to verify the origin of the optical signature measured, demonstrating that it results from nanometer-scale imperfections. This solution to optical identification with 2D materials could be employed as a robust security measure to prevent counterfeiting.
KW - optical measurement
KW - photoluminescence
KW - physical unclonable functions
KW - security
KW - transition metal dichalcogenide
UR - http://www.scopus.com/inward/record.url?scp=85056881755&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85056881755&partnerID=8YFLogxK
U2 - 10.1088/2053-1583/aa8b4d
DO - 10.1088/2053-1583/aa8b4d
M3 - Article
AN - SCOPUS:85056881755
VL - 4
JO - 2D Materials
JF - 2D Materials
SN - 2053-1583
IS - 4
M1 - 045021
ER -