Orientation imaging microscopy in two-dimensional crystals via undersampled microscopy

D. E. Angelescu, C. K. Harrison, M. L. Trawick, P. M. Chaikin, R. A. Register, D. H. Adamson

    Research output: Contribution to journalArticlepeer-review


    A novel microscopy analysis technique is presented, with applications in imaging two-dimensional grains and grain boundaries. The method allows the identification of grain shapes and orientations from large area micrographs, via the moire pattern obtained in a raster image. The observed moire pattern originates from the aliasing between a micrograph's regular sampling raster and the inherent periodicity of the elements forming the grain under study. The technique presented is very general, allowing grain analysis via many types of microscopy. We demonstrate it in this paper by using Tapping Mode Atomic Force Microscopy and Scanning Electron Microscopy on diblock copolymer thin films.

    Original languageEnglish (US)
    Pages (from-to)387-392
    Number of pages6
    JournalApplied Physics A: Materials Science and Processing
    Issue number3
    StatePublished - Feb 2004

    ASJC Scopus subject areas

    • General Chemistry
    • General Materials Science


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