Parameterized VHDL library for on-line testing

C. Stroud, M. Ding, S. Seshadri, I. Kim, S. Roy, S. Wu, R. Karri

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed.

Original languageEnglish (US)
Title of host publicationIEEE International Test Conference (TC)
Editors Anon
Number of pages10
StatePublished - 1997
EventProceedings of the 1997 IEEE International Test Conference - Washington, DC, USA
Duration: Nov 3 1997Nov 5 1997


OtherProceedings of the 1997 IEEE International Test Conference
CityWashington, DC, USA

ASJC Scopus subject areas

  • Hardware and Architecture
  • Electrical and Electronic Engineering
  • Electronic, Optical and Magnetic Materials


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