Abstract
We describe a library of parameterized VHDL models for various concurrent fault detection circuits and maintenance functions developed for simulation and synthesis of ASICs which support on-line testing and diagnostics in systems designed for high reliability and availability. Issues associated with the selection and modeling of the various online testing functions are also discussed.
| Original language | English (US) |
|---|---|
| Title of host publication | IEEE International Test Conference (TC) |
| Editors | Anon |
| Publisher | IEEE |
| Pages | 479-488 |
| Number of pages | 10 |
| State | Published - 1997 |
| Event | Proceedings of the 1997 IEEE International Test Conference - Washington, DC, USA Duration: Nov 3 1997 → Nov 5 1997 |
Other
| Other | Proceedings of the 1997 IEEE International Test Conference |
|---|---|
| City | Washington, DC, USA |
| Period | 11/3/97 → 11/5/97 |
ASJC Scopus subject areas
- Hardware and Architecture
- Electrical and Electronic Engineering
- Electronic, Optical and Magnetic Materials