Abstract
The isolation of a core through full I/O scan helps ease SOC test challenges; yet the performance of high-speed SOCs is significantly hampered. We propose a partial core encryption methodology wherein the core vendor unveils only a small part of the core logic, successfully satisfying core IP protection requirements. Once the partially encrypted cores are merged into an SOC, the system integrator performs test generation on the visible SOC logic only, greatly reducing the test generation effort expended. By utilizing the test data provided by the core vendor as well, the SOC integrator can test the SOC with no performance degradation. We present an efficient fault analysis based core encryption algorithm which is guided by judiciously computed testability measures. The experimental results confirm the significantly high encryption levels attained by the proposed encryption algorithm.
Original language | English (US) |
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Pages (from-to) | 91-94 |
Number of pages | 4 |
Journal | IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers |
DOIs | |
State | Published - 2003 |
Event | IEEE/ACM International Conference on Computer Aided Design ICCAD 2003: IEEE/ACM Digest of Technical Papers - San Jose, CA, United States Duration: Nov 9 2003 → Nov 13 2003 |
ASJC Scopus subject areas
- Software
- Computer Science Applications
- Computer Graphics and Computer-Aided Design