Abstract
Methods used to compute the reflection or transmission Mueller matrix of stratified media assume light is a monochromatic plane wave, but measurements with spectroscopic devices invariably involve a finite distribution of wavelengths and incidence angles. Consequently, there can be stark disagreement between calculation and experiment, especially when the specimen includes a thick non-opaque layer. To accurately model specimens with a thick layer, it is sometimes necessary to explicitly include the coherence of the light in models. For anisotropic and/or optically active media, we distinguish between five regimes of coherence. Algebraic expressions valid for all regimes are given. Experimental data spanning multiple regimes is modeled.
Original language | English (US) |
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Pages (from-to) | 571-577 |
Number of pages | 7 |
Journal | Applied Surface Science |
Volume | 421 |
DOIs | |
State | Published - Nov 1 2017 |
Keywords
- Depolarization
- Ellipsometry
- Multiple reflections
- Partial coherence
- Polarimetry
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- General Physics and Astronomy
- Surfaces and Interfaces
- Surfaces, Coatings and Films