Abstract
In this paper, physical models are derived for the effective resistance of multilayer graphene nanoribbon (m-GNR) interconnects. The impact of finite resistive coupling between the layers for top contacted m-GNR interconnects is considered. It is found that the addition of more parallel layers does not necessarily translate into a decrease in the overall resistance of m-GNR interconnects. Rather, the improvement in the effective resistance saturates with an increase in the number of layers. The optimal number of layers to minimize the delay and the energy-delay product of m-GNR interconnects is also evaluated. It is found that the optimal number of layers is a function of the interconnect length, interlayer resistance, and the kind of contact that is used. It is demonstrated that, for short interconnect lengths, m-GNR interconnects with smooth edges perform better compared to copper wires.
Original language | English (US) |
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Article number | 6269074 |
Pages (from-to) | 2753-2761 |
Number of pages | 9 |
Journal | IEEE Transactions on Electron Devices |
Volume | 59 |
Issue number | 10 |
DOIs | |
State | Published - 2012 |
Keywords
- Cu/low-κ
- edge roughness
- interconnects
- multilayer graphene
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering