Perpendicular magnetic anisotropy in ultrathin Co | Ni multilayer films studied with ferromagnetic resonance and magnetic x-ray microspectroscopy

F. MacIà, P. Warnicke, D. Bedau, M. Y. Im, P. Fischer, D. A. Arena, A. D. Kent

    Research output: Contribution to journalArticle

    Abstract

    Ferromagnetic resonance (FMR) spectroscopy, x-ray magnetic circular dichroism (XMCD) spectroscopy and magnetic transmission soft x-ray microscopy (MTXM) experiments have been performed to gain insight into the magnetic anisotropy and domain structure of ultrathin Co|Ni multilayer films with a thin permalloy layer underneath. MTXM images with a spatial resolution better than 25 nm were obtained at the Co L 3 edge down to an equivalent thickness of Co of only 1 nm, which establishes a new lower boundary on the sensitivity limit of MTXM. Domain sizes are shown to be strong functions of the anisotropy and thickness of the film.

    Original languageEnglish (US)
    Pages (from-to)3629-3632
    Number of pages4
    JournalJournal of Magnetism and Magnetic Materials
    Volume324
    Issue number22
    DOIs
    StatePublished - Nov 2012

    Keywords

    • Domain imaging
    • Ferromagnetic resonance (FMR)
    • Perpendicular magnetic anisotropy
    • X-ray magnetic circular dichorism
    • X-ray microscopy

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics

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