Picosecond time-resolved luminescence studies of recombination processes in CdTe

G. Ghislotti; D. Ielmini; E. Riedo; M. Martinelli; M. Dellagiovanna

doi:10.1016/S0038-1098(99)00184-2

Picosecond time-resolved luminescence studies of recombination processes in CdTe

G. Ghislotti, D. Ielmini, E. Riedo, M. Martinelli, M. Dellagiovanna

Chemical and Biomolecular Engineering

Research output: Contribution to journal › Article › peer-review

Abstract

High resistivity CdTe:In samples were studied by means of continuous and picosecond time-resolved photoluminescence (PL). The detected PL signal is affected by non-radiative trapping, while radiative recombination has an excitonic character. Two recombination lifetimes describe the measured time-resolved PL spectra: the first (30-60 ps) takes into account fast non-radiative recombination; the second lifetime is in the range 200-300 ps and can be related to exciton decay .

Original language	English (US)
Pages (from-to)	211-216
Number of pages	6
Journal	Solid State Communications
Volume	111
Issue number	4
DOIs	https://doi.org/10.1016/S0038-1098(99)00184-2
State	Published - Jun 18 1999

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
Materials Chemistry

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10.1016/S0038-1098(99)00184-2

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abstract = "High resistivity CdTe:In samples were studied by means of continuous and picosecond time-resolved photoluminescence (PL). The detected PL signal is affected by non-radiative trapping, while radiative recombination has an excitonic character. Two recombination lifetimes describe the measured time-resolved PL spectra: the first (30-60 ps) takes into account fast non-radiative recombination; the second lifetime is in the range 200-300 ps and can be related to exciton decay .",

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AU - Ghislotti, G.

AU - Ielmini, D.

AU - Riedo, E.

AU - Martinelli, M.

AU - Dellagiovanna, M.

PY - 1999/6/18

Y1 - 1999/6/18

N2 - High resistivity CdTe:In samples were studied by means of continuous and picosecond time-resolved photoluminescence (PL). The detected PL signal is affected by non-radiative trapping, while radiative recombination has an excitonic character. Two recombination lifetimes describe the measured time-resolved PL spectra: the first (30-60 ps) takes into account fast non-radiative recombination; the second lifetime is in the range 200-300 ps and can be related to exciton decay .

AB - High resistivity CdTe:In samples were studied by means of continuous and picosecond time-resolved photoluminescence (PL). The detected PL signal is affected by non-radiative trapping, while radiative recombination has an excitonic character. Two recombination lifetimes describe the measured time-resolved PL spectra: the first (30-60 ps) takes into account fast non-radiative recombination; the second lifetime is in the range 200-300 ps and can be related to exciton decay .

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JO - Solid State Communications

JF - Solid State Communications

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Picosecond time-resolved luminescence studies of recombination processes in CdTe

Abstract

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