Poster: Link between Bias, Node Sensitivity and Long-Tail Distribution in trained DNNs

Mahum Naseer, Muhammad Shafique

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Owing to their remarkable learning (and relearning) capabilities, deep neural networks (DNNs) find use in numerous real-world applications. However, the learning of these data-driven machine learning models is generally as good as the data available to them for training. Hence, training datasets with long-tail distribution pose a challenge for DNNs, since the DNNs trained on them may provide a varying degree of classification performance across different output classes. While the overall bias of such networks is already highlighted in existing works, this work identifies the node bias that leads to a varying sensitivity of the nodes for different output classes. To the best of our knowledge, this is the first work highlighting this unique challenge in DNNs, discussing its probable causes, and providing open challenges for this new research direction. We support our reasoning using an empirical case study of the networks trained on a real-world dataset.

Original languageEnglish (US)
Title of host publicationProceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation, ICST 2023
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages474-477
Number of pages4
ISBN (Electronic)9781665456661
DOIs
StatePublished - 2023
Event16th IEEE International Conference on Software Testing, Verification and Validation, ICST 2023 - Dublin, Ireland
Duration: Apr 16 2023Apr 20 2023

Publication series

NameProceedings - 2023 IEEE 16th International Conference on Software Testing, Verification and Validation, ICST 2023

Conference

Conference16th IEEE International Conference on Software Testing, Verification and Validation, ICST 2023
Country/TerritoryIreland
CityDublin
Period4/16/234/20/23

Keywords

  • Bias
  • Class-wise Performance
  • Deep Neural Networks (DNNs)
  • Input Sensitivity
  • Robustness

ASJC Scopus subject areas

  • Management of Technology and Innovation
  • Artificial Intelligence
  • Software
  • Safety, Risk, Reliability and Quality

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