Power-side-channel analysis of carbon nanotube FET based design

Chandra K.H. Suresh, Bodhisatwa Mazumdar, Sk Subidh Ali, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Continuous scaling of CMOS technology beyond sub-nanometer region has aggravated short-channel effects, resulting in increased leakage current and high power densities. Furthermore, elevated leakage current and power density render CMOS based security-critical applications vulnerable to power-side-channel attacks. Carbon Nanotubes (CNT) is a promising alternative to CMOS technology. It offers superior transport properties, excellent thermal conductivities, high current capacities, and low power densities. Besides area, power and performance, adherence to hardware security aspects have become an important criteria today. In this work, we present the first study on power-side-channel analysis of ciphers implemented using CNTFETs. Our simulation results show that for 130 power traces, the simple power analysis (SPA) attack success rate is less than 0.35 for CNTFET based ciphers, whereas it is greater than 0.95 for CMOS based ciphers. For correlation power analysis, the difference of correlation coefficient of the correct key and closest wrong key guess is 1.3 for CMOS based design, and less than 0.56 for CNTFET based ciphers for 20,000 power traces, which implies lesser distinguishability of correct key in case of CNTFETs. These results indicate that CNT offers a higher resilience to power-side-channel attacks than CMOS.

Original languageEnglish (US)
Title of host publication2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages215-218
Number of pages4
ISBN (Electronic)9781509015061
DOIs
StatePublished - Oct 20 2016
Event22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 - Sant Feliu de Guixols, Catalunya, Spain
Duration: Jul 4 2016Jul 6 2016

Publication series

Name2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016

Other

Other22nd IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2016
CountrySpain
CitySant Feliu de Guixols, Catalunya
Period7/4/167/6/16

Keywords

  • CPA
  • Carbon Nanotube (CNT) Field Effect Transistor (CNTFET)
  • Cipher
  • Hardware Security
  • Power Delay Product (PDP)
  • SPA

ASJC Scopus subject areas

  • Hardware and Architecture
  • Safety, Risk, Reliability and Quality
  • Computer Networks and Communications

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  • Cite this

    Suresh, C. K. H., Mazumdar, B., Ali, S. S., & Sinanoglu, O. (2016). Power-side-channel analysis of carbon nanotube FET based design. In 2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016 (pp. 215-218). [7604705] (2016 IEEE 22nd International Symposium on On-Line Testing and Robust System Design, IOLTS 2016). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IOLTS.2016.7604705