Predictive analysis for projecting test compression levels

Ozgur Sinanoglu, Sobeeh Almukhaizim

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Test data compression is widely employed in scan designs to tackle high test data volume and test time problems. Given the number of scan-in pins available in the ATE, architectural decisions regarding the number of internal scan chains directly impact the compression level attained. While targeting an aggressive compression level by increasing the number of internal scan chains would reduce the test data volume per encodable pattern, the cost of applying more patterns serially, to restore the coverage loss, offsets the compression benefits. Therefore, a predictive analysis is necessary to determine the best possible compression configuration, enabling the designers to make DfT architectural decisions early on in the design cycle to minimize test costs. In this paper, we propose a suite of predictive techniques geared towards projecting test cost for any given compression-based scan configuration. T he appropriate technique is selected by designers based on which stage the design is in, the design abstraction and the amount of information available, the permissible computational complexity of the techniques, and the accuracy of the projected optimal compression ratio.

Original languageEnglish (US)
Title of host publicationProceedings - International Test Conference 2010, ITC 2010
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781424472055
StatePublished - 2010
Event41st International Test Conference, ITC 2010 - Austin, TX, United States
Duration: Oct 31 2010Nov 5 2010

Publication series

NameProceedings - International Test Conference
ISSN (Print)1089-3539


Other41st International Test Conference, ITC 2010
Country/TerritoryUnited States
CityAustin, TX

ASJC Scopus subject areas

  • Electrical and Electronic Engineering
  • Applied Mathematics


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