Preface

W. Richard Bowen, Nidal Hilal

Research output: Chapter in Book/Report/Conference proceeding › Foreword/postscript

Original language	English (US)
Title of host publication	Atomic Force Microscopy in Process Engineering
Subtitle of host publication	An Introduction to AFM for Improved Processes and Products
Publisher	Elsevier
Pages	ix-xii
ISBN (Electronic)	9780080949574
ISBN (Print)	9781856175173
DOIs	https://doi.org/10.1016/B978-1-85617-517-3.00011-0
State	Published - Aug 20 2009

ASJC Scopus subject areas

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