TY - GEN
T1 - Process variation aware performance modeling and dynamic power management for multi-core systems
AU - Garg, Siddharth
AU - Marculescu, Diana
AU - Herbert, Sebastian X.
PY - 2010
Y1 - 2010
N2 - Emerging multi-core platforms are increasingly impacted by the manufacturing process variations that introduce core-to-core and chip-to-chip differences in their power and performance characteristics. This can result in unacceptable yield loss since a large fraction of manufactured parts may not meet the design specifications. In this work, we present some promising, recently proposed solutions to mitigate the impact of process variations on multi-core platforms that deal with variability aware performance modeling, and static and dynamic power reduction. These solutions demonstrate the significant benefits that can be reaped if variability information is considered at the micro-architecture and system level design abstractions.
AB - Emerging multi-core platforms are increasingly impacted by the manufacturing process variations that introduce core-to-core and chip-to-chip differences in their power and performance characteristics. This can result in unacceptable yield loss since a large fraction of manufactured parts may not meet the design specifications. In this work, we present some promising, recently proposed solutions to mitigate the impact of process variations on multi-core platforms that deal with variability aware performance modeling, and static and dynamic power reduction. These solutions demonstrate the significant benefits that can be reaped if variability information is considered at the micro-architecture and system level design abstractions.
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U2 - 10.1109/ICCAD.2010.5654293
DO - 10.1109/ICCAD.2010.5654293
M3 - Conference contribution
AN - SCOPUS:78650863315
SN - 9781424481927
T3 - IEEE/ACM International Conference on Computer-Aided Design, Digest of Technical Papers, ICCAD
SP - 89
EP - 92
BT - 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2010 IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2010
Y2 - 7 November 2010 through 11 November 2010
ER -