Quantifying resistances across nanoscale low- and high-angle interspherulite boundaries in solution-processed organic semiconductor thin films

Stephanie S. Lee, Jeffrey M. Mativetsky, Marsha A. Loth, John E. Anthony, Yueh Lin Loo

Research output: Contribution to journalArticlepeer-review

Fingerprint Dive into the research topics of 'Quantifying resistances across nanoscale low- and high-angle interspherulite boundaries in solution-processed organic semiconductor thin films'. Together they form a unique fingerprint.

Chemical Compounds

Engineering & Materials Science

Physics & Astronomy