RASTER: Runtime adaptive spatial/temporal error resiliency for embedded processors

Tuo Li, Muhammad Shafique, Jude Angelo Ambrose, Semeen Rehman, Jörg Henkel, Sri Parameswaran

Research output: Chapter in Book/Report/Conference proceedingConference contribution


Applying error recovery monotonously can either compromise the real-time constraint, or worsen the power/energy envelope. Neither of these violations can be realistically accepted in embedded system design, which expects ultra efficient realization of a given application. In this paper, we propose a HW/SWmethodology that exploits both application specific characteristics and Spatial/Temporal redundancy. Our methodology combines design-time and runtime optimizations, to enable the resultant embedded processor to perform runtime adaptive error recovery operations, precisely targeting the reliability-wise critical instruction executions. The proposed error recovery functionality can dynamically 1) evaluate the reliability cost economy (in terms of execution-time and dynamic power), 2) determine the most profitable scheme, and 3) adapt to the corresponding error recovery scheme, which is composed of spatial and temporal redundancy based error recovery operations. The experimental results have shown that our methodology at best can achieve fifty times greater reliability while maintaining the execution time and power deadlines, when compared to the state of the art.

Original languageEnglish (US)
Title of host publicationProceedings of the 50th Annual Design Automation Conference, DAC 2013
StatePublished - 2013
Event50th Annual Design Automation Conference, DAC 2013 - Austin, TX, United States
Duration: May 29 2013Jun 7 2013

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X


Other50th Annual Design Automation Conference, DAC 2013
Country/TerritoryUnited States
CityAustin, TX


  • ASIP
  • Checkpoint recovery
  • Redundancy
  • Runtime adaptation
  • Soft error

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation


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