Reconstruction of thin conductivity imperfections

Habib Ammari; Elena Beretta; Elisa Francini

doi:10.1080/00036810310001620090

Reconstruction of thin conductivity imperfections

Habib Ammari, Elena Beretta, Elisa Francini

Mathematics

Research output: Contribution to journal › Article › peer-review

Abstract

We consider the case of a uniform plane conductor containing a thin curve-like inhomogeneity of finite conductivity. In this article we prove that the imperfection can be uniquely determined from the boundary measurements of the first order correction term in the asymptotic expansion of the steady state voltage potential as the thickness goes to zero.

Original language	English (US)
Pages (from-to)	63-76
Number of pages	14
Journal	International Journal of Phytoremediation
Volume	83
Issue number	1
DOIs	https://doi.org/10.1080/00036810310001620090
State	Published - Jan 2004

Keywords

Reconstruction
Thin dielectric inhomogeneities
Uniqueness

ASJC Scopus subject areas

Environmental Chemistry
Pollution
Plant Science

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10.1080/00036810310001620090

Cite this

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title = "Reconstruction of thin conductivity imperfections",

abstract = "We consider the case of a uniform plane conductor containing a thin curve-like inhomogeneity of finite conductivity. In this article we prove that the imperfection can be uniquely determined from the boundary measurements of the first order correction term in the asymptotic expansion of the steady state voltage potential as the thickness goes to zero.",

keywords = "Reconstruction, Thin dielectric inhomogeneities, Uniqueness",

author = "Habib Ammari and Elena Beretta and Elisa Francini",

year = "2004",

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AU - Ammari, Habib

AU - Beretta, Elena

AU - Francini, Elisa

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AB - We consider the case of a uniform plane conductor containing a thin curve-like inhomogeneity of finite conductivity. In this article we prove that the imperfection can be uniquely determined from the boundary measurements of the first order correction term in the asymptotic expansion of the steady state voltage potential as the thickness goes to zero.

KW - Reconstruction

KW - Thin dielectric inhomogeneities

KW - Uniqueness

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Reconstruction of thin conductivity imperfections

Abstract

Keywords

ASJC Scopus subject areas

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