Reducing InfoVis cluttering through non uniform sampling, displacement, and user perception

Enrico Bertini, Luigi Dell'Aquila, Giuseppe Santucci

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    Clutter affects almost any kind of visual technique and can obscure the structure present in the data even in small datasets, making it hard for users to find patterns and reveal relationships. In this paper we present a general strategy to analyze and reduce clutter using a special kind of sampling, together with an ad-hoc displacement technique and perceptual issues collected through a user study. The method, defined for 2D scatter plots, is flexible enough to be used in quite different contexts. In particular, in this paper we prove its usefulness against scatter plot, radviz, and parallel coordinates visualizations.

    Original languageEnglish (US)
    Title of host publicationVisualization and Data Analysis 2006 - Proceedings of SPIE-IS and T Electronic Imaging
    DOIs
    StatePublished - 2006
    EventVisualization and Data Analysis 2006 - San Jose, CA, United States
    Duration: Jan 16 2006Jan 17 2006

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume6060
    ISSN (Print)0277-786X

    Other

    OtherVisualization and Data Analysis 2006
    CountryUnited States
    CitySan Jose, CA
    Period1/16/061/17/06

    Keywords

    • Data sampling
    • Quality metrics
    • User study
    • Visual clutter

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

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  • Cite this

    Bertini, E., Dell'Aquila, L., & Santucci, G. (2006). Reducing InfoVis cluttering through non uniform sampling, displacement, and user perception. In Visualization and Data Analysis 2006 - Proceedings of SPIE-IS and T Electronic Imaging [60600L] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 6060). https://doi.org/10.1117/12.642748