Reliable On-chip systems in the nano-era: Lessons learnt and future trends

Jörg Henkel, Lars Bauer, Nikil Dutt, Puneet Gupta, Sani Nassif, Muhammad Shafique, Mehdi Tahoori, Norbert Wehn

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Reliability concerns due to technology scaling have been a major focus of researchers and designers for several technology nodes. Therefore, many new techniques for enhancing and optimizing reliability have emerged particularly within the last five to ten years. This perspective paper introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. The focus of this paper is on perspective trends from the industrial as well as academic points of view that suggest a way for coping with reliability challenges in upcoming technology nodes.

Original languageEnglish (US)
Title of host publicationProceedings of the 50th Annual Design Automation Conference, DAC 2013
DOIs
StatePublished - 2013
Event50th Annual Design Automation Conference, DAC 2013 - Austin, TX, United States
Duration: May 29 2013Jun 7 2013

Publication series

NameProceedings - Design Automation Conference
ISSN (Print)0738-100X

Other

Other50th Annual Design Automation Conference, DAC 2013
CountryUnited States
CityAustin, TX
Period5/29/136/7/13

ASJC Scopus subject areas

  • Computer Science Applications
  • Control and Systems Engineering
  • Electrical and Electronic Engineering
  • Modeling and Simulation

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