Reliable On-chip systems in the nano-era: Lessons learnt and future trends

Jörg Henkel; Lars Bauer; Nikil Dutt; Puneet Gupta; Sani Nassif; Muhammad Shafique; Mehdi Tahoori; Norbert Wehn

doi:10.1145/2463209.2488857

Reliable On-chip systems in the nano-era: Lessons learnt and future trends

Jörg Henkel, Lars Bauer, Nikil Dutt, Puneet Gupta, Sani Nassif, Muhammad Shafique, Mehdi Tahoori, Norbert Wehn

Electrical Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Abstract

Reliability concerns due to technology scaling have been a major focus of researchers and designers for several technology nodes. Therefore, many new techniques for enhancing and optimizing reliability have emerged particularly within the last five to ten years. This perspective paper introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. The focus of this paper is on perspective trends from the industrial as well as academic points of view that suggest a way for coping with reliability challenges in upcoming technology nodes.

Original language	English (US)
Title of host publication	Proceedings of the 50th Annual Design Automation Conference, DAC 2013
DOIs	https://doi.org/10.1145/2463209.2488857
State	Published - 2013
Event	50th Annual Design Automation Conference, DAC 2013 - Austin, TX, United States Duration: May 29 2013 → Jun 7 2013

Publication series

Name	Proceedings - Design Automation Conference
ISSN (Print)	0738-100X

Other

Other	50th Annual Design Automation Conference, DAC 2013
Country/Territory	United States
City	Austin, TX
Period	5/29/13 → 6/7/13

ASJC Scopus subject areas

Computer Science Applications
Control and Systems Engineering
Electrical and Electronic Engineering
Modeling and Simulation

Access to Document

10.1145/2463209.2488857

Cite this

Henkel, J, Bauer, L, Dutt, N, Gupta, P, Nassif, S, Shafique, M, Tahoori, M & Wehn, N 2013, Reliable On-chip systems in the nano-era: Lessons learnt and future trends. in Proceedings of the 50th Annual Design Automation Conference, DAC 2013., 99, Proceedings - Design Automation Conference, 50th Annual Design Automation Conference, DAC 2013, Austin, TX, United States, 5/29/13. https://doi.org/10.1145/2463209.2488857

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AU - Shafique, Muhammad

AU - Tahoori, Mehdi

AU - Wehn, Norbert

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AB - Reliability concerns due to technology scaling have been a major focus of researchers and designers for several technology nodes. Therefore, many new techniques for enhancing and optimizing reliability have emerged particularly within the last five to ten years. This perspective paper introduces the most prominent reliability concerns from today's points of view and roughly recapitulates the progress in the community so far. The focus of this paper is on perspective trends from the industrial as well as academic points of view that suggest a way for coping with reliability challenges in upcoming technology nodes.

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BT - Proceedings of the 50th Annual Design Automation Conference, DAC 2013

Y2 - 29 May 2013 through 7 June 2013

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Reliable On-chip systems in the nano-era: Lessons learnt and future trends

Abstract

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