Repulsive interaction of Neel walls, and the internal length scale of the cross-tie wall

A Desimone, RV Kohn, S Muller, F Otto

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	57-104
Journal	Multiscale Modeling and Simulation
Volume	1
Issue number	1
State	Published - 2003

Keywords

@article{d88bdd09be304cf7834c14023a261f59,

title = "Repulsive interaction of Neel walls, and the internal length scale of the cross-tie wall",

keywords = "micromagnetics, thin films, Neel wall, cross-tie wall",

author = "A Desimone and RV Kohn and S Muller and F Otto",

year = "2003",

language = "English",

volume = "1",

pages = "57--104",

journal = "Multiscale Modeling and Simulation",

issn = "1540-3459",

publisher = "Society for Industrial and Applied Mathematics Publications",

number = "1",

}

TY - JOUR

T1 - Repulsive interaction of Neel walls, and the internal length scale of the cross-tie wall

AU - Desimone, A

AU - Kohn, RV

AU - Muller, S

AU - Otto, F

PY - 2003

Y1 - 2003

KW - micromagnetics

KW - thin films

KW - Neel wall

KW - cross-tie wall

M3 - Article

SN - 1540-3459

VL - 1

SP - 57

EP - 104

JO - Multiscale Modeling and Simulation

JF - Multiscale Modeling and Simulation

IS - 1

ER -