TY - GEN
T1 - Robustness for smart cyber physical systems and internet-of-Things
T2 - 17th IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2018
AU - Kriebel, Florian
AU - Rehman, Semeen
AU - Hanif, Muhammad Abdullah
AU - Khalid, Faiq
AU - Shafique, Muhammad
N1 - Publisher Copyright:
© 2018 IEEE.
Copyright:
Copyright 2018 Elsevier B.V., All rights reserved.
PY - 2018/8/7
Y1 - 2018/8/7
N2 - In recent years, the exponential growth of internet of things (IoT) and cyber physical systems (CPS) in safety critical applications has imposed severe reliability and security challenges. This is due to the heterogeneity and complex connectivity of the CPS components as well as error-prone and vulnerable nature of the underlying devices, harsh operating environments, and escalating security attacks. Different reliability threats (like soft errors, process variation and the temperature-induced dark silicon problem) have posed diverse challenges, which led to the development of various mitigation techniques on different layers of the CPS/IoT stack. Similarly, security threats (like manipulation of communication channels, hardware components and associated software) led to the development of different detection and protection techniques on different layers of the CPS/IoT stack, e.g., cross-layer and intra-layer connectivity. Towards this, the associated costs and overhead as well as potentially conflicting goals are important to be considered, e.g., most of the soft error mitigation techniques are based on redundancy and most of the security-related techniques require continuous runtime monitoring, obfuscation, attestation, and trusted execution environments. This paper first discusses different existing options for approaching this problem at different system layers, i.e., adaptive reliability and security management. These different solutions will provide a wide variety of options to choose from, as a basis for selection and adaptation, to solve reliability-related problems at design-Time and run-Time. Due to the exponential increase in the complexity and functional requirements, there is a trend towards employing Machine Learning in CPSs and IoT systems. Therefore, we will show how systems can be protected against different security and reliability threats when Machine Learning sub-systems are employed in CPS/IoT.
AB - In recent years, the exponential growth of internet of things (IoT) and cyber physical systems (CPS) in safety critical applications has imposed severe reliability and security challenges. This is due to the heterogeneity and complex connectivity of the CPS components as well as error-prone and vulnerable nature of the underlying devices, harsh operating environments, and escalating security attacks. Different reliability threats (like soft errors, process variation and the temperature-induced dark silicon problem) have posed diverse challenges, which led to the development of various mitigation techniques on different layers of the CPS/IoT stack. Similarly, security threats (like manipulation of communication channels, hardware components and associated software) led to the development of different detection and protection techniques on different layers of the CPS/IoT stack, e.g., cross-layer and intra-layer connectivity. Towards this, the associated costs and overhead as well as potentially conflicting goals are important to be considered, e.g., most of the soft error mitigation techniques are based on redundancy and most of the security-related techniques require continuous runtime monitoring, obfuscation, attestation, and trusted execution environments. This paper first discusses different existing options for approaching this problem at different system layers, i.e., adaptive reliability and security management. These different solutions will provide a wide variety of options to choose from, as a basis for selection and adaptation, to solve reliability-related problems at design-Time and run-Time. Due to the exponential increase in the complexity and functional requirements, there is a trend towards employing Machine Learning in CPSs and IoT systems. Therefore, we will show how systems can be protected against different security and reliability threats when Machine Learning sub-systems are employed in CPS/IoT.
KW - Aging
KW - CPS
KW - Dark Silicon
KW - Deep Neural Networks
KW - IoT
KW - Machine Learning
KW - Process Variations
KW - Reliability
KW - Security
KW - Soft Errors
UR - http://www.scopus.com/inward/record.url?scp=85052128895&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85052128895&partnerID=8YFLogxK
U2 - 10.1109/ISVLSI.2018.00111
DO - 10.1109/ISVLSI.2018.00111
M3 - Conference contribution
AN - SCOPUS:85052128895
SN - 9781538670996
T3 - Proceedings of IEEE Computer Society Annual Symposium on VLSI, ISVLSI
SP - 581
EP - 586
BT - Proceedings - 2018 IEEE Computer Society Annual Symposium on VLSI, ISVLSI 2018
PB - IEEE Computer Society Press
Y2 - 9 July 2018 through 11 July 2018
ER -