Robustness of Lorenz-Mie microscopy against defects in illumination

Henrique W. Moyses, Bhaskar J. Krishnatreya, David G. Grier

    Research output: Contribution to journalArticle

    Abstract

    Lorenz-Mie analysis of colloidal spheres' holograms has been reported to achieve remarkable resolution not only for the spheres' three-dimensional positions, but also for their sizes and refractive indexes. Here we apply numerical modeling to establish limits on the instrumental resolution for tracking and characterizing individual colloidal spheres with Lorenz-Mie microscopy.

    Original languageEnglish (US)
    Pages (from-to)5968-5973
    Number of pages6
    JournalOptics Express
    Volume21
    Issue number5
    DOIs
    StatePublished - Mar 11 2013

    ASJC Scopus subject areas

    • Atomic and Molecular Physics, and Optics

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  • Cite this

    Moyses, H. W., Krishnatreya, B. J., & Grier, D. G. (2013). Robustness of Lorenz-Mie microscopy against defects in illumination. Optics Express, 21(5), 5968-5973. https://doi.org/10.1364/OE.21.005968