Robustness of Lorenz-Mie microscopy against defects in illumination

Henrique W. Moyses; Bhaskar J. Krishnatreya; David G. Grier

doi:10.1364/OE.21.005968

Robustness of Lorenz-Mie microscopy against defects in illumination

Henrique W. Moyses, Bhaskar J. Krishnatreya, David G. Grier

Research output: Contribution to journal › Article › peer-review

Abstract

Lorenz-Mie analysis of colloidal spheres' holograms has been reported to achieve remarkable resolution not only for the spheres' three-dimensional positions, but also for their sizes and refractive indexes. Here we apply numerical modeling to establish limits on the instrumental resolution for tracking and characterizing individual colloidal spheres with Lorenz-Mie microscopy.

Original language	English (US)
Pages (from-to)	5968-5973
Number of pages	6
Journal	Optics Express
Volume	21
Issue number	5
DOIs	https://doi.org/10.1364/OE.21.005968
State	Published - Mar 11 2013

ASJC Scopus subject areas

Atomic and Molecular Physics, and Optics

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10.1364/OE.21.005968

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title = "Robustness of Lorenz-Mie microscopy against defects in illumination",

abstract = "Lorenz-Mie analysis of colloidal spheres' holograms has been reported to achieve remarkable resolution not only for the spheres' three-dimensional positions, but also for their sizes and refractive indexes. Here we apply numerical modeling to establish limits on the instrumental resolution for tracking and characterizing individual colloidal spheres with Lorenz-Mie microscopy.",

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AU - Grier, David G.

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AB - Lorenz-Mie analysis of colloidal spheres' holograms has been reported to achieve remarkable resolution not only for the spheres' three-dimensional positions, but also for their sizes and refractive indexes. Here we apply numerical modeling to establish limits on the instrumental resolution for tracking and characterizing individual colloidal spheres with Lorenz-Mie microscopy.

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Robustness of Lorenz-Mie microscopy against defects in illumination

Abstract

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