RT-level fault simulation based on symbolic propagation

O. Sinanoglu, A. Orailoglu

Research output: Contribution to conferencePaperpeer-review


The rapid rise in size and complexity of VLSI circuits has stimulated a need to handle fault simulation at higher levels of abstraction. We outline an RT-level fault simulation technique that utilizes symbolic data to group fault effects. Experimental results show that the proposed methodology provides superior speed-ups and accurate fault coverages.

Original languageEnglish (US)
Number of pages6
StatePublished - 2001
Event19th IEEE VLSI Test Symposium - Marina del Rey, CA, United States
Duration: Apr 29 2001May 3 2001


Other19th IEEE VLSI Test Symposium
Country/TerritoryUnited States
CityMarina del Rey, CA

ASJC Scopus subject areas

  • Computer Science Applications
  • Electrical and Electronic Engineering


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