TY - GEN
T1 - Scalable Diffusion Models with Transformers
AU - Peebles, William
AU - Xie, Saining
N1 - Publisher Copyright:
© 2023 IEEE.
PY - 2023
Y1 - 2023
N2 - We explore a new class of diffusion models based on the transformer architecture. We train latent diffusion models of images, replacing the commonly-used U-Net backbone with a transformer that operates on latent patches. We analyze the scalability of our Diffusion Transformers (DiTs) through the lens of forward pass complexity as measured by Gflops. We find that DiTs with higher Gflops - through increased transformer depth/width or increased number of input tokens - consistently have lower FID. In addition to possessing good scalability properties, our largest DiT-XL/2 models outperform all prior diffusion models on the class-conditional ImageNet 512×512 and 256×256 benchmarks, achieving a state-of-the-art FID of 2.27 on the latter.
AB - We explore a new class of diffusion models based on the transformer architecture. We train latent diffusion models of images, replacing the commonly-used U-Net backbone with a transformer that operates on latent patches. We analyze the scalability of our Diffusion Transformers (DiTs) through the lens of forward pass complexity as measured by Gflops. We find that DiTs with higher Gflops - through increased transformer depth/width or increased number of input tokens - consistently have lower FID. In addition to possessing good scalability properties, our largest DiT-XL/2 models outperform all prior diffusion models on the class-conditional ImageNet 512×512 and 256×256 benchmarks, achieving a state-of-the-art FID of 2.27 on the latter.
UR - http://www.scopus.com/inward/record.url?scp=85185876820&partnerID=8YFLogxK
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U2 - 10.1109/ICCV51070.2023.00387
DO - 10.1109/ICCV51070.2023.00387
M3 - Conference contribution
AN - SCOPUS:85185876820
T3 - Proceedings of the IEEE International Conference on Computer Vision
SP - 4172
EP - 4182
BT - Proceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023
Y2 - 2 October 2023 through 6 October 2023
ER -