Abstract
Scan based test is a double edged sword. On one hand, it is a powerful test technique. On the other hand, it is an equally powerful attack tool. In this paper we show that scan chains can be used as a side channel to recover secret keys from a hardware implementation of the Data Encryption Standard (DES). By loading pairs of known plaintexts with one-bit difference in the normal mode and then scanning out the internal state in the test mode, we first determine the position of all scan elements in the scan chain. Then, based on a systematic analysis of the structure of the nonlinear substitution boxes, and using three additional plaintexts we discover the DES secret key. Finally, some assumptions in the attack are discussed.
| Original language | English (US) |
|---|---|
| Title of host publication | Proceedings - International Test Conference |
| Pages | 339-344 |
| Number of pages | 6 |
| State | Published - 2004 |
| Event | Proceedings - International Test Conference 2004 - Charlotte, NC, United States Duration: Oct 26 2004 → Oct 28 2004 |
Other
| Other | Proceedings - International Test Conference 2004 |
|---|---|
| Country/Territory | United States |
| City | Charlotte, NC |
| Period | 10/26/04 → 10/28/04 |
ASJC Scopus subject areas
- General Engineering