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Scan to nonscan conversion via test cube analysis
Ozgur Sinanoglu
Electrical Engineering
Computer Engineering
Center for Cyber Security
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peer-review
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Dive into the research topics of 'Scan to nonscan conversion via test cube analysis'. Together they form a unique fingerprint.
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Computer Science
Data Compression
100%
Postprocessing
100%
Integrated Circuits
100%
Performance Test
100%
Engineering
Automatic Test Pattern Generation
100%
Flip Flop Circuits
100%
Keyphrases
Partial Scan
100%
Scan Flip-flop
33%
Full-scan
33%
Material Science
Electronic Circuit
100%