Abstract
Local fluorescence probes based on CdSe semiconductor nanocrystals were prepared and tested by recording scanning near-field optical microscopy (SNOM) images of calibration samples and fluorescence resonance energy transfer SNOM (FRET SNOM) images of acceptor dye molecules in homogeneously deposited onto a glass substrate. Thousands of nanocrystals contribute to the signal when this probe is used as a local fluorescence source while only tens of those (the most apical) are involved in imaging for the FRET SNOM operation mode. The dip-coating method used to make the probe enables diminishing the number of active fluorescent nanocrystals easily. Prospects to realize FRET SNOM based on a single fluorescence centre using such an approach are briefly described.
Original language | English (US) |
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Pages (from-to) | 274-278 |
Number of pages | 5 |
Journal | Journal of Microscopy |
Volume | 210 |
Issue number | 3 |
DOIs | |
State | Published - Jun 1 2003 |
Keywords
- Fluorescence resonance energy transfer
- Near-field optics
- Semiconductor nanocrystals
ASJC Scopus subject areas
- Pathology and Forensic Medicine
- Histology