Abstract
Exact analytical results for the scattering of a plane transverse-electric electromagnetic wave with a nonlinear thin film is derived. Optical bistable and multistable behaviors in the reflectivity as a function of the input intensity are found.
Original language | English (US) |
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Pages (from-to) | 571-574 |
Number of pages | 4 |
Journal | Journal of the Optical Society of America B: Optical Physics |
Volume | 5 |
Issue number | 2 |
DOIs | |
State | Published - Feb 1988 |
ASJC Scopus subject areas
- Statistical and Nonlinear Physics
- Atomic and Molecular Physics, and Optics