TY - GEN
T1 - Securing digital microfluidic biochips by randomizing checkpoints
AU - Tang, Jack
AU - Karri, Ramesh
AU - Ibrahim, Mohamed
AU - Chakrabarty, Krishnendu
N1 - Publisher Copyright:
© 2016 IEEE.
PY - 2016/7/2
Y1 - 2016/7/2
N2 - Much progress has been made in digital microfluidic biochips (DMFB), with a great body of literature addressing low-cost, high-performance, and reliable operation. Despite this progress, security of DMFBs has not been adequately addressed. We present an analysis of a DMFB system prone to malicious modification of routes and propose a DMFB defense based on spatio-Temporal randomized checkpoints using CCD cameras. Absent the knowledge of the time-and space-randomized checkpoints, an attacker cannot navigate the DMFB without alerting the system. We present an algorithm to guide the placement and timing of the checkpoints such that the probability that an attack can evade detection is minimized. The efficacy of the defense mechanism is illustrated with a case study under stealthy malicious modifications.
AB - Much progress has been made in digital microfluidic biochips (DMFB), with a great body of literature addressing low-cost, high-performance, and reliable operation. Despite this progress, security of DMFBs has not been adequately addressed. We present an analysis of a DMFB system prone to malicious modification of routes and propose a DMFB defense based on spatio-Temporal randomized checkpoints using CCD cameras. Absent the knowledge of the time-and space-randomized checkpoints, an attacker cannot navigate the DMFB without alerting the system. We present an algorithm to guide the placement and timing of the checkpoints such that the probability that an attack can evade detection is minimized. The efficacy of the defense mechanism is illustrated with a case study under stealthy malicious modifications.
UR - http://www.scopus.com/inward/record.url?scp=85013942368&partnerID=8YFLogxK
UR - http://www.scopus.com/inward/citedby.url?scp=85013942368&partnerID=8YFLogxK
U2 - 10.1109/TEST.2016.7805856
DO - 10.1109/TEST.2016.7805856
M3 - Conference contribution
AN - SCOPUS:85013942368
T3 - Proceedings - International Test Conference
BT - Proceedings - 2016 IEEE International Test Conference, ITC 2016
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 47th IEEE International Test Conference, ITC 2016
Y2 - 15 November 2016 through 17 November 2016
ER -