TY - GEN
T1 - Securing IJTAG against data-integrity attacks
AU - Elnaggar, Rana
AU - Karri, Ramesh
AU - Chakrabarty, Krishnendu
N1 - Publisher Copyright:
© 2018 IEEE.
PY - 2018/5/29
Y1 - 2018/5/29
N2 - The IEEE Std. 1687 (IJTAG) facilitates access to on-chip instruments in complex system-on-chip designs. However, a major security vulnerability in IJTAG has yet to be addressed. IJTAG supports the integration of tapped and wrapped instruments at the IP provider with hidden test-data registers (TDRs). The instruments with hidden TDRs can manipulate the data that is shifted through them. We propose the addition of shadow test-data registers by the trusted IJTAG integrator to protect the shifted data from illegitimate manipulation by malicious third-party IPs. In addition, we use information-flow tracking to identify the modified bits during the attack and the attacking instruments in an IJTAG network. We present security proofs, simulation results and the overheads associated with these countermeasures for various benchmarks.
AB - The IEEE Std. 1687 (IJTAG) facilitates access to on-chip instruments in complex system-on-chip designs. However, a major security vulnerability in IJTAG has yet to be addressed. IJTAG supports the integration of tapped and wrapped instruments at the IP provider with hidden test-data registers (TDRs). The instruments with hidden TDRs can manipulate the data that is shifted through them. We propose the addition of shadow test-data registers by the trusted IJTAG integrator to protect the shifted data from illegitimate manipulation by malicious third-party IPs. In addition, we use information-flow tracking to identify the modified bits during the attack and the attacking instruments in an IJTAG network. We present security proofs, simulation results and the overheads associated with these countermeasures for various benchmarks.
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U2 - 10.1109/VTS.2018.8368642
DO - 10.1109/VTS.2018.8368642
M3 - Conference contribution
AN - SCOPUS:85048361185
T3 - Proceedings of the IEEE VLSI Test Symposium
SP - 1
EP - 6
BT - Proceedings - 2018 IEEE 36th VLSI Test Symposium, VTS 2018
PB - IEEE Computer Society
T2 - 36th IEEE VLSI Test Symposium, VTS 2018
Y2 - 22 April 2018 through 25 April 2018
ER -