Abstract
The sequence with which the polymer photoactive layer is annealed during inverted solar cell fabrication not only affects device characterization, it also influences the stability of devices dramatically. Devices in which the photoactive layer is annealed after top electrode deposition outlast devices in which the photoactive layer is annealed before top electrode deposition. This difference in device stability is traced to the grain structure and grain size of the top electrode, which in turn shows strong dependence on the underlying morphology of the photoactive layer. Annealing the photoactive layer causes significant roughening of the film; subsequent metal deposition results in electrodes with small grains. It is moisture penetration through the grain boundaries of the metal electrode that results in the deterioration of photovoltaic characteristics in devices in which the photoactive layer is annealed before top electrode deposition.
Original language | English (US) |
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Pages (from-to) | 1483-1488 |
Number of pages | 6 |
Journal | Organic Electronics |
Volume | 10 |
Issue number | 8 |
DOIs | |
State | Published - Dec 2009 |
Keywords
- Annealing sequence
- Device stability
- P3HT
- PCBM
- Polymer solar cells
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Biomaterials
- General Chemistry
- Condensed Matter Physics
- Materials Chemistry
- Electrical and Electronic Engineering