Simulation and analysis of negative-bias temperature instability aging on power analysis attacks

Keyphrases

• Negative Bias Temperature Instability 100%
• Transistor Aging 100%
• Power Analysis Attack 100%
• CPA Attack 33%
• Nanoscale Design 33%
• Circuit Failure 33%
• Circuit Lifetime 33%
• Circuit Performance Degradation 33%
• Template Attack 33%

Computer Science

• Power Analysis 100%
• Experimental Result 33%
• Performance Degradation 33%
• Limiting Factor 33%

Engineering

• Negative-Bias Temperature Instability 100%
• Circuit Performance 33%