Single frame holographic particle image velocimetry

Lisa Dixon, Fook Chiong Cheong, David G. Grier

    Research output: Chapter in Book/Report/Conference proceedingConference contribution

    Abstract

    We present a novel method for single frame particle image velocimetry of micron scale spheres based on holographic video microscopy. Our approach takes advantage of the blurring that recorded holograms suffer when a sphere moves during the exposure period of the camera. By measuring the angular variance in intensity of the blurred hologram, we extract a modelindependent metric for the particle velocity. We find this to be accurate for speeds that permit characterization of other properties of the sphere, such as radius and refractive index through Lorenz-Mie mocroscopy. Singl-frame holographic velocimetry yields information on the dynamics of a particle, without sacrificing any other measurements.

    Original languageEnglish (US)
    Title of host publicationPractical Holography XXIV
    Subtitle of host publicationMaterials and Applications
    DOIs
    StatePublished - 2010
    EventPractical Holography XXIV: Materials and Applications - San Francisco, CA, United States
    Duration: Jan 24 2010Jan 27 2010

    Publication series

    NameProceedings of SPIE - The International Society for Optical Engineering
    Volume7619
    ISSN (Print)0277-786X

    Other

    OtherPractical Holography XXIV: Materials and Applications
    CountryUnited States
    CitySan Francisco, CA
    Period1/24/101/27/10

    ASJC Scopus subject areas

    • Electronic, Optical and Magnetic Materials
    • Condensed Matter Physics
    • Computer Science Applications
    • Applied Mathematics
    • Electrical and Electronic Engineering

    Fingerprint Dive into the research topics of 'Single frame holographic particle image velocimetry'. Together they form a unique fingerprint.

  • Cite this

    Dixon, L., Cheong, F. C., & Grier, D. G. (2010). Single frame holographic particle image velocimetry. In Practical Holography XXIV: Materials and Applications [761904] (Proceedings of SPIE - The International Society for Optical Engineering; Vol. 7619). https://doi.org/10.1117/12.840534