Slack removal for enhanced reliability and trust

Abishek Ramdas, Samah Mohamed Saeed, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Timing slacks possibly lead to reliability issues and/or security vulnerabilities, as they may hide small delay defects and malicious circuitries injected during fabrication, namely, hardware Trojans. While possibly harmless immediately after production, small delay defects may trigger reliability problems as the part is being used in field, presenting a significant threat for mission-critical applications. Hardware Trojans remain dormant while the part is tested and validated, but then get activated to launch an attack when the chip is deployed in security-critical applications. In this paper, we take a deeper look into these problems and their underlying reasons, and propose a design technique to maximize the detection of small delay defects as well as the hardware Trojans. The proposed technique eliminates all slacks by judiciously inserting delay units in a small set of locations in the circuit, thereby rendering a simple set of transition fault patterns quite effective in catching parts with small delay defects or Trojans. Experimental results also justify the efficacy of the proposed technique in improving the quality of test while retaining the pattern count and care bit density intact.

Original languageEnglish (US)
Title of host publicationProceedings - 2014 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2014
PublisherIEEE Computer Society
ISBN (Print)9781479949724
DOIs
StatePublished - 2014
Event2014 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2014 - Santorini, Greece
Duration: May 6 2014May 8 2014

Publication series

NameProceedings - 2014 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2014

Other

Other2014 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2014
CountryGreece
CitySantorini
Period5/6/145/8/14

Keywords

  • At-speed Testing
  • Hardware Trojan
  • Slacks
  • Small Delay Defects

ASJC Scopus subject areas

  • Hardware and Architecture

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  • Cite this

    Ramdas, A., Saeed, S. M., & Sinanoglu, O. (2014). Slack removal for enhanced reliability and trust. In Proceedings - 2014 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2014 [6850660] (Proceedings - 2014 9th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2014). IEEE Computer Society. https://doi.org/10.1109/DTIS.2014.6850660