Sneak path testing and fault modeling for multilevel memristor-based memories

Sachhidh Kannan, Ramesh Karri, Ozgur Sinanoglu

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Fingerprint Dive into the research topics of 'Sneak path testing and fault modeling for multilevel memristor-based memories'. Together they form a unique fingerprint.

Engineering & Materials Science