Special Section on: Fault-Tolerant VLSI Systems

Research output: Contribution to journalArticle

Original languageEnglish (US)
Pages (from-to)106-107
Number of pages2
JournalIEEE Transactions on Reliability
Volume48
Issue number2
DOIs
StatePublished - Jan 1999

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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