Original language | English (US) |
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Article number | 6548920 |
Journal | Proceedings of the IEEE VLSI Test Symposium |
DOIs | |
State | Published - 2013 |
Event | 2013 IEEE 31st VLSI Test Symposium, VTS 2013 - Berkeley, CA, United States Duration: Apr 29 2013 → May 1 2013 |
ASJC Scopus subject areas
- Computer Science Applications
- Electrical and Electronic Engineering